-
Integrating ferroelectric negative capacitance (NC) into the field-effect transistor (FET) promises to break fundamental limits of power dissipation known as Boltzmann tyranny. However, realizing the stable static negative capacitance in the non-transient non-…
arxiv
I. Luk'yanchuk, A. Razumnaya, A. Sené, Y. Tikhonov 等
2021-08-06T07:02:28Z
置信度 0.78
cond-mat.mes-hallcond-mat.mtrl-sci
-
We report herein fabrication and characterization of a thin-film transistor (TFT) using single-crystalline, epitaxial SrTiO3 film, which was grown by a pulsed laser deposition technique followed by the thermal annealing treatment in an oxygen atmosphere. Altho…
arxiv
Kosuke Uchida, Akira Yoshikawa, Kunihito Koumoto, Takeharu Kato 等
2009-12-22T08:48:44Z
置信度 0.78
cond-mat.mtrl-scicond-mat.str-el
-
Basic SiC bipolar transistors have been studied in the past for their applications where high power or high temperature operation is required. However since the current gain in SiC bipolar transistors is very low and therefore, a large base drive is required i…
arxiv
M. Jagadesh Kumar, Amit Sharma
2010-08-18T06:01:03Z
置信度 0.78
cond-mat.mtrl-sci
-
Zero-frequency spectral densities of current noise, charge noise, and their cross-correlation are calculated for the SET transistor in the co-tunneling regime. The current noise has a form expected for the uncorrelated co-tunneling events. Charge noise is crea…
arxiv
D. V. Averin
2000-10-03T23:18:21Z
置信度 0.78
cond-mat.mes-hall
-
Neural network (NN)-based transistor compact modeling has recently emerged as a transformative solution for accelerating device modeling and SPICE circuit simulations. However, conventional NN architectures, despite their widespread adoption in state-of-the-ar…
arxiv
Rodion Novkin, Hussam Amrouch
2025-03-19T13:49:50Z
置信度 0.78
cs.LG
-
In our previous papers on ballistic quantum transport in nano-transistors [J. Appl. Phys. 98, 84308 (2005)] it was demonstrated that under certain conditions it is possible to reduce the three-dimensional transport problem to an effectively one-dimensional one…
arxiv
U. Wulf
2008-08-19T11:41:06Z
置信度 0.78
cond-mat.mes-hall
-
crossref
2024-05-31T09:01:07Z
置信度 0.70
-
crossref
Reza Hosseini
2012-08-15T11:43:47Z
置信度 0.70
-
crossref
2020-04-08T17:25:47Z
置信度 0.70
-
Tunnel field-effect transistors (TFETs) are potential successors of metal-oxide-semiconductor FETs because scaling the supply voltage below 1 V is possible due to the absence of a subthreshold-swing limit of 60 mV/decade. The modeling of the TFET performance, …
crossref
Anne S. Verhulst, Bart Sorée, Daniele Leonelli, William G. Vandenberghe 等
2010-01-28T23:09:33Z
置信度 0.70
-
crossref
Reza Nekovei, Daryoush Shiri, Amit Verma
2024-11-07T19:47:39Z
置信度 0.70
-
The paper introduces an analytical model for gate all around (GAA) or Surrounding Gate Metal Oxide Semiconductor Field Effect Transistor (SG-MOSFET) inclusive of quantum mechanical effects. The classical oxide capacitance is replaced by the capacitance incorpo…
crossref
P. Vimala, N.R. Nithin Kumar
2020-11-30T08:42:04Z
置信度 0.70
-
crossref
B. Jyothi, B.V. Ramana Reddy, Mansi Jhamb
2024-08-14T17:17:02Z
置信度 0.70
-
crossref
Shafat Jahangir, Quazi Deen Mohd Khosru, Anisul Haque
2009-01-29T16:44:06Z
置信度 0.70
-
Abstract We use superposition method to model the electrostatic characteristics of high-k stacked Gate-All-Around Hetero Junction TFETs (GAA-HJTFETs). The hetero junction is set up by using Ge/Si material in the source/channel respectively. The modeling is acc…
preprints
usha C, P Vimala, K Ramkumar, V.N. Ramakrishnan
2021
置信度 0.74
-
crossref
2025-04-29T15:31:59Z
置信度 0.70
-
crossref
Laixiang Qin, Chunlai Li, Yiqun Wei, Ziang Xie 等
2023-07-14T11:53:05Z
置信度 0.70
-
crossref
Chunshan Yin, P.C.H. Chan, V.W.C. Chan
2003-09-30T14:33:34Z
置信度 0.70
-
crossref
Jaya Madan, R. S. Gupta, Rishu Chaujar
2015-08-10T09:13:22Z
置信度 0.70
-
crossref
Anil Kumar Gundu, Volkan Kursun
2022-03-24T21:59:13Z
置信度 0.70
-
This paper presents a germanium-around-source gate-all-around tunnelling field-effect transistor (GAS GAA TFET). The electrical characteristics of the device were studied and compared with those of silicon gate-all-around and germanium-based-source gate-all-ar…
crossref
Ke Han, Shanglin Long, Zhongliang Deng, Yannan Zhang 等
2020-02-03T11:28:31Z
置信度 0.70
-
crossref
Anshul Saxena, Deboraj Muchahary, B Acharya
2025-12-02T18:44:54Z
置信度 0.70
-
The evolution from FinFET to Gate-All-Around (GAA) technology marks a pivotal advancement in semiconductor manufacturing, addressing critical challenges in transistor scaling and power efficiency. This transition represents a fundamental shift in device archit…
crossref
Rajesh Arsid
2025-04-02T16:06:41Z
置信度 0.70
-
crossref
Mohammad Tabarsi Sochelmaei, Arash Yazdanpanah Goharrizi
2022-07-20T19:37:22Z
置信度 0.70
-
crossref
Sanjeet Kumar Sinha, Sweta Chander
2025-11-17T18:38:59Z
置信度 0.70
-
crossref
Usha C, Vimala P
2020-07-27T20:02:36Z
置信度 0.70
-
crossref
Kanchan Saini, Vinod Kumar
2024-10-08T17:33:10Z
置信度 0.70
-
crossref
Awanit Sharma, Shyam Akashe
2013-12-18T08:51:08Z
置信度 0.70
-
crossref
Awanit Sharma, Shyam Akashe
2014-09-17T05:25:04Z
置信度 0.70
-
An analytical model for the transport phenomena of a heterojunction triple metal gate all around tunneling field effect transistor (HTM GAA TFET) is developed for the first time in this paper. The continuous surface potential profile of the staggered-gap align…
crossref
Marjana Mahdia, Quazi Deen Mohd Khosru
2020-09-21T10:05:38Z
置信度 0.70
-
crossref
Myunghwan Ryu, Youngmin Kim
2017-03-07T22:06:47Z
置信度 0.70
-
Low-frequency noise is used to study the electronic transport in arrays of 14 nm gate length vertical silicon nanowire devices. We demonstrate that, even at such scaling, the electrostatic control of the gate-all-around is sufficient in the sub-threshold volta…
crossref
N. Clément, X. L. Han, G. Larrieu
2013-12-27T23:54:44Z
置信度 0.70
-
crossref
Nitika Sharma, Nidhi Garg, Gurpreet Kaur
2021-03-07T18:07:13Z
置信度 0.70
-
crossref
D. Jackuline Moni, T. Jaspar Vinitha Sundari
2016-09-19T16:52:22Z
置信度 0.70
-
crossref
Linyuan Zhao, Wenjie Chen, Renrong Liang, Yu Liu 等
2019-07-04T22:13:57Z
置信度 0.70
-
crossref
Amit Verma, Reza Nekovei, Daryoush Shiri
2024-08-22T17:38:42Z
置信度 0.70
-
crossref
Ru Huang, Runsheng Wang, Ming Li
2020-07-16T13:03:43Z
置信度 0.70
-
crossref
Wenlun ZHANG, Baokang WANG
2021-01-14T22:09:33Z
置信度 0.70
-
crossref
Hema Mehta, Harsupreet Kaur
2017-10-25T15:26:23Z
置信度 0.70
-
Abstract III-V semiconductors have been intensively studied with the goal of realizing metal-oxide-semiconductor field-effect transistors (MOSFETs) with high mobility, a high on-off ratio, and low power consumption as next-generation transistors designed to re…
crossref
K. Takase, Y. Ashikawa, G. Zhang, K. Tateno 等
2017-04-11T10:44:46Z
置信度 0.70
-
crossref
Rishu Chaujar, Mekonnen Getnet Yirak
2024-02-17T23:04:13Z
置信度 0.70
-
crossref
Vanita Mehta, Sandeep Kumar Arya, Rajiv Sharma
2024-07-29T18:59:35Z
置信度 0.70
-
crossref
A. Martinez, A. R. Brown, S. Roy, A. Asenov
2011-05-03T15:39:52Z
置信度 0.70
-
crossref
Hironori Gamo, Junichi Motohisa, Katsuhiro Tomioka
2022-11-04T01:40:39Z
置信度 0.70
-
crossref
Awanit Sharma
2015-11-10T09:45:02Z
置信度 0.70
-
crossref
Yiqi Sun, Xintong Zhang
2026-06-21T14:42:07Z
置信度 0.70
-
Abstract In nanoscale transistors, quantum mechanical effects such as tunneling and quantization significantly influence device characteristics. However, large-scale quantum transport simulation still remains a challenging field, making it difficult to account…
europepmc
Kyoung Yeon Kim, Hong-Hyun Park, Seonghoon Jin, Soo-Young Park 等
2024
置信度 0.80
-
crossref
Kaushik Chandra Deva Sarma, Santanu Sharma
2015-03-17T23:17:44Z
置信度 0.70
-
A gate-all-around (GAA) field effect transistor with vacuum gate dielectric is presented as a structure free from hot-carrier injection and bias temperature instability. A conventional GAA fabrication process is used along with selective removal of the sacrifi…
crossref
Jin-Woo Han, Dong-Il Moon, Jae Sub Oh, Yang-Kyu Choi 等
2014-06-26T14:36:47Z
置信度 0.70
-
crossref
Chen-Ming Lee, Bing-Yue Tsui
2010-06-24T14:40:18Z
置信度 0.70
-
crossref
Seunguk Han
2024-10-16T00:21:36Z
置信度 0.70
-
crossref
Raj Kumar, Arvind Kumar
2020-09-15T05:03:03Z
置信度 0.70
-
crossref
Aapurva Kaul, Sonam Rewari, Deva Nand
2023-12-23T19:02:17Z
置信度 0.70
-
crossref
You-Tai Chang, Pei-Wen Li, Horng-Chih Lin
2019-08-01T19:58:42Z
置信度 0.70
-
crossref
B. Ray, S. Mahapatra
2008-08-20T11:06:00Z
置信度 0.70
-
crossref
Wen-Hao Zhang, Zun-Chao Li, Yun-He Guan, Ye-Fei Zhang
2017-07-05T10:39:48Z
置信度 0.70
-
Abstract This work presents the design and optimization of a gate-stacked underlap-engineered silicon nanowire MOSFET (GSUESNW-MOSFET) with an HfO 2 spacer for the 10-nm technology node. The electric field generated by the device work function difference at th…
crossref
Hina Ismat, Singam Aruna, Srinivasa Naik K, B Balaji
2026-03-17T23:00:27Z
置信度 0.70
-
crossref
Neel Chatterjee, Kshitij Chopra, Kshitij Bhatia, Sujata Pandey
2016-01-07T22:18:48Z
置信度 0.70
-
crossref
Imtiyaz Ahmad khan, Sanjeev Kumar Manhas, Arvind Kumar, Mahendra Pakala
2024-01-11T20:18:45Z
置信度 0.70
-
crossref
G. Larrieu, Y. Guerfi, X.L Han, N. Clement
2015-11-12T18:03:10Z
置信度 0.70
-
crossref
Cher Ming Tan, Xiangchen Chen
2014-04-23T06:07:16Z
置信度 0.70
-
crossref
Hasan Ansari, Kannan U.M., Seongjae Cho
2023-09-06T04:15:44Z
置信度 0.70
-
crossref
Mayuresh Joshi, Arya Dutt, Sanjana Tiwari, Prakhar Nigam 等
2021-06-21T21:42:07Z
置信度 0.70
-
crossref
Monika Sharma, Mridula Gupta, Rakhi Narang, Manoj Saxena
2019-01-24T03:18:03Z
置信度 0.70
-
crossref
Deyuan Xiao, Xi Wang, Jing Chen, Xiaolu Huang 等
2010-11-30T21:09:55Z
置信度 0.70
-
crossref
Khairul Alam
2009-07-01T03:14:16Z
置信度 0.70
-
crossref
Rishu Chaujar, Mekonnen Getnet Yirak
2022-12-21T03:03:20Z
置信度 0.70
-
This paper presents a one-transistor dynamic random-access memory (1T-DRAM) cell based on a gate-all-around junction-less field-effect transistor (GAA-JLFET) with a Si/SiGe heterostructure for high-density memory applications. The proposed 1T-DRAM achieves the…
crossref
Young Jun Yoon, Jae Sang Lee, Dong-Seok Kim, Sang Ho Lee 等
2020-12-13T20:56:57Z
置信度 0.70
-
crossref
Jhen-Yu Tsai, Hsin-Hui Hu, Yung-Chun Wu
2015-12-08T17:19:12Z
置信度 0.70
-
crossref
Pankaj Kumar, Sangeeta Singh, Neelesh Pratap Singh, Bharti Modi 等
2014-10-22T16:11:39Z
置信度 0.70
-
crossref
K. Morimoto, Y. Hirai, K. Yuki, K. Morita
2015-11-06T07:35:44Z
置信度 0.70
-
crossref
Richa Gupta, Rakesh Vaid
2016-03-02T06:19:08Z
置信度 0.70
-
crossref
Achinta Baidya, Vishal Kumar Pandey, Aditya Abhiraj, Kartik Swamy 等
2026-02-18T21:13:38Z
置信度 0.70
-
crossref
S Jahangir, I Jahangir, Q D M Khosru, S Hossain
2011-01-13T16:35:39Z
置信度 0.70
-
crossref
Xiangchen Chen
2019-10-02T12:38:40Z
置信度 0.70
-
crossref
Priyank Rastogi, Avirup Dasgupta, and Yogesh Singh Chauhan
2018-10-09T15:51:26Z
置信度 0.70
-
crossref
Yogesh Pratap, Manoj Kumar, Mridula Gupta, Subhasis Haldar 等
2016-10-20T20:51:50Z
置信度 0.70
-
crossref
Ran Bi, Baotong Zhang, Jianhuan Wang, Jianjun Zhang 等
2024-01-24T18:33:59Z
置信度 0.70
-
crossref
Bruce Draper, Murat Okandan, Marty Shaneyfelt
2009-12-11T15:56:57Z
置信度 0.70
-
crossref
Anil Kumar Gundu, Volkan Kursun
2022-02-02T21:35:17Z
置信度 0.70
-
crossref
Arvind Bisht, Yogendra Pratap Pundir, Tushar Goel, Pankaj Kumar Pal
2025-01-10T20:15:55Z
置信度 0.70
-
crossref
Rouzbeh Molaei Imen Abadi, Seyed Ali Sedigh Ziabari
2016-04-30T07:14:21Z
置信度 0.70
-
crossref
Po-Chun Huang, Tzu-Shiun Sheu, Chen-Chia Chen, Lu-An Chen 等
2010-03-01T13:38:25Z
置信度 0.70
-
crossref
M. Ziaei-Moayyed, P. Resnick, B. Draper, M. Okandan
2012-03-26T17:46:16Z
置信度 0.70
-
crossref
Awanit Sharma, Shyam Akashe
2014-09-18T06:53:38Z
置信度 0.70
-
crossref
Min Jae Kang, Ilho Myeong, Myounggon Kang, Hyungcheol Shin
2018-09-07T14:30:38Z
置信度 0.70
-
crossref
Shivani Chopra, Subha Subramaniam, Sangeeta M. Joshi, R. N. Awale
2016-06-23T19:53:53Z
置信度 0.70
-
crossref
Khairul Alam, Md. Abu Abdullah
2011-06-07T15:37:16Z
置信度 0.70
-
An analytical subthreshold swing (SS) model for Cylindrical Gate-All-Around Junctionless Field Effect Transistor (CGAA JLFET) has been proposed in this work. Basically, 2D Poisson equation has been solved along the channel while assuming a parabolic potential …
crossref
Imtiaz Ahmed, Quazi D. M. Khosru
2016-05-20T09:56:42Z
置信度 0.70
-
crossref
P. Dainesi, K.E. Moselund, L. Thevenaz, A.M. Ionescu
2008-02-06T17:33:00Z
置信度 0.70
-
crossref
Haiquan Zhao, JianPeng Zhao, Ruihan Huang, Mo Li 等
2023-06-27T17:26:02Z
置信度 0.70
-
crossref
Jaemin Lee, Myunghwan Ryu, Youngmin Kim
2015-05-27T18:05:15Z
置信度 0.70
-
crossref
Mohammad Karbalaei, Daryoosh Dideban, Hadi Heidari
2019-11-22T12:09:43Z
置信度 0.70
-
crossref
Hao Wang, Sheng Chang, Cheng Wang, Yue Hu 等
2013-10-31T00:13:53Z
置信度 0.70
-
crossref
Kaushik Chandra Deva Sarma, Santanu Sharma
2015-01-21T14:38:47Z
置信度 0.70
-
crossref
Shengdong Zhang, Ruqi Han, Hongmei Wang, Mansun Chan
2004-02-26T18:30:08Z
置信度 0.70
-
crossref
M Gaffar, Md M Alam, S A Mamun, M A Zaman 等
2011-01-13T16:35:39Z
置信度 0.70
-
This work performs a detailed comparison of the channel width folding effectiveness of the FinFET, vertically stacked nanosheet transistor (VNSFET), and vertically stacked nanowire transistor (VNWFET) under the constraints of the same vertical (fin) height and…
crossref
Hei Wong, Kuniyuki Kakushima
2022-05-20T00:18:11Z
置信度 0.70
-
crossref
Soumya S. Mohanty, Sikha Mishra, Guru Prasad Mishra
2025-05-29T17:06:14Z
置信度 0.70
-
crossref
Shivani Yadav, Sonam Rewari
2024-04-08T20:33:40Z
置信度 0.70